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IEICE Transactions on Information and Systems 2005 E88-D(1):158-161; doi:10.1093/ietisy/E88-D.1.158
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Copyright © 2005 The Institute of Electronics, Information and Communication Engineers

Letter

Huffman-Based Test Response Coding

Hideyuki ICHIHARA1, Michihiro SHINTANI2 and Tomoo INOUE1

1 The authors are with the Faculty of Information Sciences, Hiroshima City University, Hiroshima-shi, 731-3194 Japan. E-mail: ichihara{at}im.hiroshima-cu.ac.jp, 2 The author is with the Graduate School of Information Sciences, Hiroshima City University, Hiroshima-shi, 731-3194 Japan.

Test compression/decompression is an efficient method for reducing the test application cost. In this letter we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing and it is independent of the fault model and the structure of a circuit-under-test. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented.

Key Words: Huffman code, test compression, test response, test application time, ATE

Manuscript received May 31, 2004.


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